市場調查報告書

AFA (全快閃記憶體儲存陣列(All-Flash Array))的效能實驗架構:2018年

AFA Performance Testing Framework, 2018

出版商 IDC 商品編碼 599379
出版日期 內容資訊 英文 22 Pages
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AFA (全快閃記憶體儲存陣列(All-Flash Array))的效能實驗架構:2018年 AFA Performance Testing Framework, 2018
出版日期: 2018年01月04日內容資訊: 英文 22 Pages
簡介

本報告提供AFA(全快閃記憶體儲存陣列)的效能實驗相關調查,彙整AFA市場概要,AFA的行動與特徵,AFA效能試驗架構,未來展望,重要的建議等資料。

IDC的見解

關於本調查

情形概要

  • 全閃存陣列市場
  • AFA測試需要一個新的方法
  • 了解閃存存儲機制
  • 影響AFA績效的關鍵因素
  • 試驗概要·範圍
  • AFA效能試驗架構
    • 階段1:工作負載定義·安裝&事前調整·資料集準備
    • 階段2:標準工作負載實驗
    • 階段3:功能實驗
    • 階段4:故障插入實驗
    • 階段5:浸泡測試
    • 解釋測試結果

未來展望

重要指導

相關調查

目錄
Product Code: US43286017

This IDC study provides a framework for end users to use when testing all-flash arrays (AFAs). IDC performed substantial research to understand and document the unique performance characteristics of AFAs, evaluated various storage performance and other testing tools, and worked with array vendors as well as independent testing labs. The result is a proposed test plan that will allow end users to accurately and time efficiently characterize how AFAs will perform in their environments against their workloads."AFAs exhibit unique performance characteristics that are very different from HDD-based storage architectures and are used with 3rd Platform computing workloads that have their own unique I/O profiles," said Eric Burgener, research director, Storage. "To understand how AFAs will perform against the real-world workloads for which they are being increasingly deployed, administrators must understand both of these factors and use them as inputs when designing AFA testing regimens."

IDC Opinion

In This Study

Situation Overview

  • The All-Flash Array Market
  • AFA Testing Requires a New Approach
  • Understanding Flash Storage Behaviors
  • Critical Factors Impacting AFA Performance
  • Testing Overview and Scope
  • The AFA Performance Testing Framework
    • Phase 1: Workload Definition, Setup and Preconditioning, and Data Set Preparation (One to Two Days)
      • Workload Definition
      • Setup and Preconditioning
      • Data Set Preparation and Artificial Aging
    • Phase 2: Baseline Workload Testing (One to Two Days)
    • Phase 3: Functional Testing (One Day)
    • Phase 4: Fault Injection Testing (One Day)
    • Phase 5: Soak Test
    • Interpreting the Test Results

Future Outlook

Essential Guidance

Learn More

  • Related Research
  • Synopsis
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