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市場調查報告書

全球薄膜測量系統市場

Global Thin Film Metrology Systems Market 2015-2019

出版商 TechNavio (Infiniti Research Ltd.) 商品編碼 294978
出版日期 內容資訊 英文 63 Pages
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全球薄膜測量系統市場 Global Thin Film Metrology Systems Market 2015-2019
出版日期: 2015年01月28日 內容資訊: 英文 63 Pages
簡介

2014年的全球薄膜測量系統市場的收益,多由亞太地區帶來。這是由於韓國、台灣、中國、日本的平面電視、PC、行動終端、平板電腦的ODM及OEM的需求增加。全球薄膜測量系統市場,預計從2014年到2019年,以3.4%的年複合成長率(CAGR)擴大。

本報告提供全球薄膜測量系統市場現狀與未來預測、成長要素與課題、主要供應商分析等。

第1章 摘要整理

第2章 簡稱清單

第3章 調查範圍

  • 市場概要
  • 主要的產品

第4章 市場調查手法

  • 市場調查流程
  • 調查手法

第5章 簡介

第6章 市場形勢

  • 市場概要
  • 以收益為準的市場規模與預測
  • 以收益為準的市場規模與預測
  • 波特的五力分析

第7章 價值鏈分析

第8章 各用途的市場分類

第9章 地理區分

  • 全球低溫運輸市場:各地區的預測
  • 北美
    • 市場規模與預測
  • 歐洲
    • 市場規模與預測
  • 亞太地區
    • 市場規模與預測
  • 其他地區
    • 市場規模與預測

第10章 購買標準

第11章 市場成長因素

第12章 成長因素與其影響

第13章 市場課題

第14章 成長因素與課題的影響

第15章 市場趨勢

第16章 趨勢與其影響

第17章 業者情勢

  • 競爭模式
  • 市場佔有率分析
  • 其他卓越供應商

第18章 主要供應商分析

  • Americold Logistics
  • Lineage Logistics
  • Swire Cold Chain Logistics
  • Preferred Freezer Services

第19章 相關報告

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目錄
Product Code: IRTNTR5173

About Thin-film Metrology Systems

Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.

TechNavio's analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.

Covered in this Report

This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:

  • ODMs
  • OEMs
  • Foundries

Key Regions

  • Americas
  • APAC
  • EMEA

Key Vendors

  • KLA-Tencor
  • Nanometrics
  • Nova Measuring Instruments
  • Rudolph Technologies

Other Prominent Vendors

  • Hitachi High-Technologies
  • SCREEN Holdings
  • Semilab

Key Market Driver

  • Increased Level of Complexity in ICs
  • For a full, detailed list, view our report

Key Market Challenge

  • Cyclic Nature of Semiconductor Industry
  • For a full, detailed list, view our report

Key Market Trend

  • Increasing Demand for Integration and Miniaturization of Semiconductor Devices
  • For a full, detailed list, view our report

Key Questions Answered in this Report

  • What will the market size be in 2019 and what will the growth rate be?
  • What are the key market trends?
  • What is driving this market?
  • What are the challenges to market growth?
  • Who are the key vendors in this market space?
  • What are the market opportunities and threats faced by the key vendors?
  • What are the strengths and weaknesses of the key vendors?

Table of Contents

01. Executive Summary

02. List of Abbreviations

03. Scope of the Report

  • 03.1. Market Overview
  • 03.2. Product Offerings

04. Market Research Methodology

  • 04.1. Market Research Process
  • 04.2. Research Methodology

05. Introduction

06. Market Landscape

  • 06.1. Market Size and Forecast
  • 06.2. Five Forces Analysis

07. Geographical Segmentation

  • 07.1. Global Thin Film Metrology Systems Market by Geography

08. Buying Criteria

09. Market Growth Drivers

10. Drivers and their Impact

11. Market Challenges

12. Impact of Drivers and Challenges

13. Market Trends

14. Trends and their Impact

15. Vendor Landscape

  • 15.1. Competitive Scenario
  • 15.2. Market Share Analysis 2013
  • 15.3. Other Prominent Vendors
    • 15.3.1. SCREEN Holdings
    • 15.3.2. Semilab
    • 15.3.3. Hitachi High-Technologies

16. Key Vendor Analysis

  • 16.1. KLA-Tencor
    • 16.1.1. Key Facts
    • 16.1.2. Business Overview
    • 16.1.3. Product Segmentation
    • 16.1.4. Services Offered
    • 16.1.5. Geographical Segmentation by Revenue 2014
    • 16.1.6. SWOT Analysis
  • 16.2. Nanometrics
    • 16.2.1. Key Facts
    • 16.2.2. Business Overview
    • 16.2.3. Business Segmentation by Revenue 2013
    • 16.2.4. Business Segmentation by Revenue 2012 and 2013
    • 16.2.5. Geographical Segmentation by Revenue 2013
    • 16.2.6. Business Strategy
    • 16.2.7. Recent Developments
    • 16.2.8. SWOT Analysis
  • 16.3. Nova Measuring Instruments
    • 16.3.1. Key Facts
    • 16.3.2. Business Overview
    • 16.3.3. Product Segmentation
    • 16.3.4. Geographical Segmentation by Revenue 2013
    • 16.3.5. Business Strategy
    • 16.3.6. Key Developments
    • 16.3.7. SWOT Analysis
  • 16.4. Rudolph Technologies
    • 16.4.1. Key Facts
    • 16.4.2. Business Overview
    • 16.4.3. Business Segmentation by Revenue 2013
    • 16.4.4. Business Segmentation by Revenue 2012 and 2013
    • 16.4.5. Geographical Segmentation by Revenue 2013
    • 16.4.6. Business Strategy
    • 16.4.7. Recent Developments
    • 16.4.8. SWOT Analysis

17. Other Reports in this Series

List of Exhibits

  • Exhibit 1: Market Research Methodology
  • Exhibit 2: Semiconductor Value Chain
  • Exhibit 3: Global Thin Film Metrology Systems Market (US$ million)
  • Exhibit 4: Global Thin Film Metrology Systems Market by Geography 2014-2019 (CAGR)
  • Exhibit 5: Global Thin Film Metrology Systems Market by Geography 2014-2019
  • Exhibit 6: Global Thin Film Metrology Systems Market by Geography 2014-2019 (US$ million)
  • Exhibit 7: Global Thin Film Metrology Systems Market by Vendor Segmentation 2014
  • Exhibit 8: KLA-Tencor: Product Segmentation
  • Exhibit 9: KLA-Tencor: Services Offered
  • Exhibit 10: KLA-Tencor: Geographical Segmentation by Revenue 2014
  • Exhibit 11: Nanometrics: Business Segmentation by Revenue 2013
  • Exhibit 12: Nanometrics: Business Segmentation by Revenue 2012 and 2013 (US$ billion)
  • Exhibit 13: Nanometrics: Geographical Segmentation by Revenue 2013
  • Exhibit 14: Nova Measuring Instruments: Product Segmentation 2013
  • Exhibit 15: Nova Measuring Instruments: Geographical Segmentation by Revenue 2013
  • Exhibit 16: Rudolph Technologies: Business Segmentation by Revenue 2013
  • Exhibit 17: Rudolph Technologies: Business Segmentation by Revenue 2012 and 2013(US$ million)
  • Exhibit 18: Rudolph Technologies: Geographical Segmentation by Revenue 2013
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