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市場調查報告書

中小半導體設備廠商的利基市場和策略

Niche Markets and Strategies for Small/Mid-size Semiconductor Equipment Companies

出版商 The Information Network
出版日期 2011年08月 商品編碼 122068
內容資訊 英文  
價格
US $ 2495 PDF by E-mail
US $ 2595 PDF by E-mail and Hard Copy


中小半導體設備廠商的利基市場和策略 是由出版商The Information Network在2011年08月所出版的。 這份英文市場調查報告書價格從美金2495起跳。

簡介

本報告書內容包括:中小半導體設備廠商的趨勢和策略分析、300mm晶圓加工的利基市場、SUB 3mm晶圓設備的利基市場上各個趨勢及分類對今後的展望和課題等彙整、內容綱要摘記如下:

第1章 介紹

第2章 300mm晶圓加工的利基市場

  • 介紹
  • 晶圓等級過程
    • 介紹
    • 覆晶晶片/WLP加工上的課題和趨勢
    • 石板印刷上的課題和趨勢
    • UBM蝕刻的課題和趨勢
    • 金屬化的課題和趨勢
    • 市場分析
  • 3-D TSV
    • 重要課題的檢證
    • 成本構造
    • 重要加工技術
    • 重要開發分類的評價
    • TSV設備預測
  • 不揮發性記憶體設備MRAM、RRAM、及FeRAM
    • MRAM的加工必要條件
    • RRAM的加工必要條件
    • FeRAM的加工必要條件
    • 商品化的準則
  • 超薄型晶圓
    • 超薄型晶圓的應用
    • 基板的薄膜化
    • 背部金屬化必要條件
    • 表面應力去除
    • 超薄型晶圓市場

第3章 SUB 3mm晶圓設備的利基市場

  • 介紹
  • MEMS
    • 市場基礎建設
    • 應用和市場預測
    • 設備及材料供應商市場
  • 高亮度LED(HB-LED)
    • 高亮度LED技術及應用的近年進步
    • 加工設備
    • 有機EL製造
    • 全球的有機EL市場展望
    • 全球的高亮度LED市場展望
  • 化合物半導體
    • GaA設備
    • 設備趨勢
    • 晶圓尺寸
    • GaA IC市場預測
    • 和SiGe的競爭
  • HDD用薄膜導線/頭燈
    • HDD趨勢
    • 墨頭市場預測
    • 頭燈加工
    • 頭燈製造
    • CMP的課題
    • 石板印刷的課題
  • 巨大超音波
    • 巨大超音波設備的基本構造
    • AIN Layer品質必要條件
    • 巨大超音波及FBAR濾光片設備的必要條件
    • 巨大超音波市場

圖表

目錄

Abstract

In this report we identify areas of semiconductor-related technologies where a small or mid-sized company can compete. These high-tech applications segmented as those are fabricated on 300mm wafers and those built on non-300mm wafers.

Table of Contents

Chapter 1 - Introduction

Chapter 2 - Niche Markets for PROCESSES for 300mm Wafers

  • 2.1 Introduction
  • 2.2 Wafer Level Processing (WLP)
    • 2.2.1 Introduction
    • 2.2.2 Flip Chip/WLP Processing Issues and Trends
      • Wafer Bumping
      • Wafer Level Packaging
      • Pad Redistribution
      • Wafer Bumping Costs
    • 2.2.3 Lithography Issues And Trends
    • 2.2.4 UBM Etch Issues And Trends
    • 2.2.5 Metallization Issues and Trends
      • Gold Bumping Metallization
      • Solder Bumping Metallization
    • 2.2.6 Analysis of WLP Market
  • 2.3 3-D TSV
    • 2.3.1 Insight Into Critical Issues
    • 2.3.2 Cost Structure
    • 2.3.3 Critical Processing Technologies
    • 2.3.4 Evaluation Of Critical Development Segments
    • 2.3.5 TSV Device Forecast
  • 2.4 Non-volatile Memory Devices MRAM, RRAM and FeRAM
    • 2.4.1 Processing Requirements for MRAMs
    • 2.4.2 Processing Requirements for RRAMs
    • 2.4.3 Processing Requirements for FeRAMs
    • 2.4.4 Roadmap for Commercialization
  • 2.5 Ultrathin Wafers
    • 2.5.1 Applications for Ultrathin Wafers
    • 2.5.2 Substrate Thinning
    • 2.5.3 Backside Metallization Requirements
    • 2.5.4 Surface Stress Relief
    • 2.5.5 Ultrathin Wafer Market

Chapter 3 - Niche Markets for EQUIPMENT for SUB 300mm Wafers

  • 3.1 Introduction
  • 3.2 MEMs
    • 3.2.1 The MEMS Market Infrastructure
    • 3.2.2 Forecast Of The Key Applications And Markets
      • MEMS Device Market Forecast
      • MEMS System Market Forecast
    • 3.2.3 Markets for Equipment and Materials Suppliers
  • 3.3 HB-LEDs
    • 3.3.1 Recent Progress in High Brightness LED Technology and Applications
    • 3.3.2 Processing Equipment
    • 3.3.3 Materials of Construction
    • 3.3.4 OLED Manufacturing
    • 3.3.5 Outlook for the Worldwide OLED Market
    • 3.3.6 Outlook for the Worldwide HB-LED Market
  • 3.4 Compound Semiconductors
    • 3.4.1 GaAs Devices
    • 3.4.2 Equipment Trends
    • 3.4.3 Wafer Sizes
    • 3.4.4 GaAs IC Market Forecast
    • 3.4.5 Competing Against SiGe
  • 3.5 Thin Film Read/Write Heads for HDD
    • 3.5.1 Trends in HDDs
    • 3.5.2 Recording Head Market Forecast
    • 3.5.3 Head Processing
    • 3.5.4 Head Fabrication - CMP, Deposition, Lithography
    • 3.5.5 CMP Challenges
    • 3.5.6 Lithography Challenges
  • 3.6 Bulk Acoustic Wave (BAW)
    • 3.6.1 Basic Elements of the BAW Device
    • 3.6.2 AlN Layer Quality Requirements
    • 3.6.3 Equipment Requirements for BAW and FBAR Filtering Devices
    • 3.6.4 Bulk Acoustic Wave (BAW) Market

TABLES

  • 2.1. Common UBM Stacks For Solder And Gold Bumping
  • 2.2. Solder Bumping Guidelines
  • 2.3. ITRS Pin Counts For Different Applications
  • 2.4. Pillar-WLP CSP Guidelines
  • 2.5. Pad Redistribution Guidelines
  • 2.6. UBM Film Etchants
  • 2.7. Common UBM Stacks For Gold And Solder Bumping
  • 2.8. WLP Demand By Device (Units)
  • 2.9. WLP Demand By Device (Wafers)
  • 2.1. Forecast Of TSV Devices By Wafers
  • 3.1. MEMS Device Markets
  • 3.2. MEMS System Markets
  • 3.3. MEMS Equipment Markets
  • 3.4. Color, Wavelength Material Of LED
  • 3.5. Comparison of LED, HB-LED, UHB-LED Characteristics
  • 3.6. Epitaxy Metrics from Initial Solid-State Lighting Manufacturing R&D Roadmap
  • 3.7. Process Control Metrics
  • 3.8. Production Method for Various LEDs
  • 3.9. GaAs IC Market Forecast
  • 3.1. Comparison Of Piezoelectric Materials For BAW Applications

FIGURES

  • 2.1. Solder Bumping Process
  • 2.2. Pillar-WLPCSP Process
  • 2.3. Pad Redistribution Process
  • 2.4. Via First (iTSV) Cost Of Ownership
  • 2.5. Via First (iTSV) Cost Of Ownership Front And Back Side
  • 2.6. Via First (iTSV) Process Flow
  • 2.7. iTSV Versus pTSV Cost Of Ownership
  • 2.8. Effect Of TSV Depth And Diameter On Cost
  • 2.9. Illustration Of Bosch Process
  • 2.1. Process And Equipment Flow For EMC3D Consortium Members
  • 2.11. Various TSV Integration Schemes
  • 2.12. Forecast OF TSV Devices By Wafers
  • 3.1. Operation of LED
  • 3.2. Market drivers for LED Biz and Applications
  • 3.3. SSL vs. Classical Technologies
  • 3.4. LED Performance vs. Traditional Light Sources
  • 3.5. Pareto Analysis Of SSL Manufacturing Costs
  • 3.6. Nanoimprint Lithography System
  • 3.7. Regular LED (white) Front-End Steps
  • 3.8. Schematic of AMOLED
  • 3.9. Active Matrix OLED Capacity and Demand Forecast
  • 3.1. 2008 LED Market by Sector
  • 3.11. Worldwide LED Market Forecast 2007-2012
  • 3.12. Schematic of GaAs MESFET
  • 3.13. Schematic of GaAs HEMT Device
  • 3.14. Schematic of GaAs HBT Device
  • 3.15. Schematic of GaAs HBT Device
  • 3.16. pHEMT MMIC Process Flow Chart
  • 3.17. 0.15 Micron 3MI Process Cross Section
  • 3.18. InGaP HBT Process
  • 3.19. Worldwide SiGe Market Forecast
  • 3.2. Hard Disk Drive Roadmap
  • 3.21. Decrease In Average Price Of Storage
  • 3.22. Heads Per Drive -- 2000-2010
  • 3.23. Increase In Areal Density
  • 3.24. Market Forecast Of Recording Head Consumption
  • 3.25. Heads Per Drive Forecast
  • 3.26. Thin Film Head Structure
  • 3.27. Critical Features In Thin Film Head Structure
  • 3.28. Spin Valve Head Structure
  • 3.29. Cross-Sectional View TFH Stacks
  • 3.3. Cross-Sectional View Of A TFH Design
  • 3.31. CMP Slurry System For Tfh Wafer Polishing
  • 3.32. Critical Feature Trends In Thin Film Heads
  • 3.33. Application Space For Rf Filters
  • 3.34. FBAR Diagram
  • 3.35. BAW-SMR Diagram
  • 3.36. Worldwide BAW Forecast
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