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AFA Performance Testing Framework

出版商 IDC 商品編碼 316849
出版日期 內容資訊 英文 22 Pages
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AFA(全Flash陣列)性能實驗的組成架構 AFA Performance Testing Framework
出版日期: 2014年10月17日 內容資訊: 英文 22 Pages





  • flash型陣列市場
  • flash型陣列實驗是必須的新方法
  • flash儲存行動的理解
  • 影響flash型陣列性能的重要要素
  • 實驗概要、範圍
  • AFA性能實驗的組成架構
    • 階段1:工作負載定義,設置和預處理,及資料集準備(從1日到2日)
    • 階段2:基準工作負載實驗(從1日到2日)
    • 階段3:功能實驗(1日)
    • 階段4:故障注射實驗(1日)
    • 階段5:浸水實驗
  • 實驗結果的解釋




  • 相關調查
  • 附錄:Solid State Standards Associations
    • Storage Networking Industry Association
    • JEDEC Solid State Technology Association
  • 摘要


Product Code: 251951

This IDC study provides a framework for end users to test flash-based arrays. It is primarily designed for use with AFAs, all-flash configurations of HFAs, and highly flash-optimized HFAs. IDC performed substantial research to understand and document the unique performance characteristics of flash-based arrays, evaluated various storage performance and other testing tools, and worked with array vendors as well as independent testing labs. The result is a proposed test plan that will allow end users to accurately characterize how flash-based arrays will perform in their environments against their workloads.

"Flash-based arrays exhibit unique performance characteristics that are very different from HDD-based storage architectures and are used with workloads that are very different from those of the recent past," said Eric Burgener, research director, IDC Storage Systems. "As they execute test plans with these arrays, these differences need to be taken into account in order to be relevant for real-world 3rd Platform workloads."

Table of Contents

IDC Opinion

In This Study

Situation Overview

  • The Flash-Based Array Market
  • Flash-Based Array Testing Requires a New Approach
  • Understanding Flash Storage Behaviors
  • Critical Factors Impacting Flash-Based Array Performance
  • Testing Overview and Scope
  • The AFA Performance Testing Framework
    • Phase 1: Workload Definition, Setup and Preconditioning, and Data Set Preparation (One to Two Days)
      • Workload Definition
      • Setup and Preconditioning
      • Data Set Preparation and Artificial Aging
    • Phase 2: Baseline Workload Testing (One to Two Days)
    • Phase 3: Functional Testing (One Day)
    • Phase 4: Fault Injection Testing (One Day)
    • Phase 5: Soak Test
  • Interpreting the Test Results

Future Outlook

Essential Guidance

Learn More

  • Related Research
  • Appendix: Solid State Standards Associations
    • Storage Networking Industry Association
    • JEDEC Solid State Technology Association
  • Synopsis

List of Tables

  • Table: AFA Test Plan Summary

List of Figures

  • Figure: Example of Real-World AFA Performance Graph
  • Figure: Example of Good and Bad AFA Performance Testing Results
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